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The electrical compliance test specification drafted by PCI-SIG requires testing loop response of the Phase Locked Loop (PLL) used in add-in cards to generate a local transmitter clock from a 100 MHz reference oscillator. There are several possible methods for performing this test. This paper provides an overview of the significant ones, including one method based on an instrumentation-quality clock recovery instrument. The clock recovery method is a single-instrument solution that provides superior test accuracy, resolution, and throughput at minimal cost. The measurement output results are displayed directly without the need for interpretation, minimizing chances for operator error.